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Nano- and Micro-metrology
作者
Heidi Ottevaere / Peter DeWolf / Diederik S. Wiersma
出版SPIE-International Society for Optical Engineering, 2005
ISBN
UOM:39015061007632
主題
Technology & Engineering
Deep Proton Writing: A Rapid Prototyping Tool for ...
作者
Jürgen Van Erps / Alex Hermanne / Christof Debaes / Heidi Ottevaere / Hugo Thienpont / Michael Vervaeke
出版2011
ISBN
9533079703 / 9789533079707
Nano- and Micro-metrology
作者
Heidi Ottevaere / Peter DeWolf / Diederik S. Wiersma
出版SPIE-International Society for Optical Engineering, 2005
ISBN
UOM:39015061007632
主題
Technology & Engineering