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Extreme Ultraviolet (EUV) Lithography III.
出版2012
ISBN
0819489786 / 9780819489784
Serpents
作者
Roland Bauchot / Cassian Bon / Patrick David
出版Editions Artemis, 2005
ISBN
2844164102 / 9782844164100
Design and Fabrication of Advanced EUV Diffractive...
作者
Patrick P. Naulleau / Eric M. Gullikson / J. Alexander Liddle / Erik H. Anderson / Farhad Salmassi
出版2003
ISBN
OCLC:316485593
Holographic Optical Elements for the Extreme-ultra...
作者
Patrick P. Naulleau / Eric M. Gullikson / Erik H. Anderson / Farhad Salmassi
出版2006
ISBN
OCLC:316326440
Preparations for EUV Interferometry of the 0.3 NA ...
作者
Kenneth A. Goldberg / Patrick P. Naulleau / Paul E. Denham / Eric Gullikson / J. Alexander Liddle / Erik H. Anderson / Bruce Harteneck / Keith H. Jackson / Senajith B. Rekawa
出版2003
ISBN
OCLC:316505906
חרוזים בני בית
出版1985
ISBN
OCLC:232879639
Modeling of EUV Photoresists with a Resist Point S...
作者
Patrick Naulleau / Jason P. Cain / Costas J. Spanos
出版2005
ISBN
OCLC:316301132
Investigation of the Current Resolution Limits of ...
作者
Kenneth A. Goldberg / Patrick Naulleau / Paul Denham / Clemens Rammeloo / Jason P. Cain / Kim Dean / Brian Hoef / Bruno La Fontaine / Adam Pawloski / Carl Larson / Greg Wallraff
出版2005
ISBN
OCLC:316307854
Resist-based Measurement of Contrast Transfer Func...
作者
Patrick Naulleau / Jason P. Cain / Costas J. Spanos
出版2005
ISBN
OCLC:316301125
Darwin Art Treasures Exhibition
出版1868
ISBN
OCLC:31468600
Lithographic Measurement of EUV Flare in the 0.3-N...
作者
Patrick Naulleau / Jason P. Cain / Costas J. Spanos
出版2005
ISBN
OCLC:316301119
Critical Dimension Sensitivity to Post-exposure Ba...
作者
Patrick Naulleau / Jason P. Cain / Costas J. Spanos
出版2005
ISBN
OCLC:316301128
Two-wave Pattern Shift Aberration Monitor for Cent...
作者
Patrick Naulleau / Jason P. Cain / Bruno La Fontaine / Adam Pawloski / Costas Spanos / Obert Reeves Wood / Gregory McIntyre / AndrewR. Neureuther
出版2005
ISBN
OCLC:316325845