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ISBN : 9781118717967總數: gridview
Measurement Technology for Micro-Nanometer Devices
作者
Wendong Zhang / Xiujian Chou / Tielin Shi / Zongmin Ma / Haifei Bao / Jingdong Chen / Liguo Chen / Dachao Li / Chenyang Xue
出版John Wiley & Sons, 2017-01-17
ISBN
9781118717967 / 1118717961
主題
Technology & Engineering