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Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
Jürgen BeyererFernando Puente LeónFabio RemondinoMark Shortis
出版SPIE, 2013-04-09
ISBN08194960739780819496072
URLhttp://books.google.com.hk/books?id=1QGSngEACAAJ&hl=&source=gbs_api
註釋Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.