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Automated Visual Inspection and Machine Vision

Jürgen Beyerer

出版	SPIE, 2015-05-19
主題	Technology & Engineering / Optics
ISBN	16284169049781628416909
URL	http://books.google.com.hk/books?id=1hbqjgEACAAJ&hl=&source=gbs_api

註釋

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.