其他書名 | Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA |
出版 | ASM International, 2012 |
主題 | Technology & Engineering / Electronics / GeneralTechnology & Engineering / Electronics / Circuits / General |
ISBN | 16150399539781615039951 |
URL | http://books.google.com.hk/books?id=2CXlQeTuWO8C&hl=&source=gbs_api |
EBook | SAMPLE |