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Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA
出版ASM International, 2012
主題Technology & Engineering / Electronics / GeneralTechnology & Engineering / Electronics / Circuits / General
ISBN16150399539781615039951
URLhttp://books.google.com.hk/books?id=2CXlQeTuWO8C&hl=&source=gbs_api
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