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ISTFA 2009
其他書名
Conference Proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA
出版ASM International, 2009-01-01
主題Technology & Engineering / Electrical
ISBN16150309219781615030927
URLhttp://books.google.com.hk/books?id=2wJgavSp-HkC&hl=&source=gbs_api
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註釋Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.