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Measurements of a Newly Designed BPM for the Tevatron Electron Lens 2
M. Olson
G. Kuznetsov
V. D. Shiltsev
V. Kamerdzhiev
X. L. Zhang
V. E. Scarpine
B. Fellenz
出版
United States. Department of Energy
, 2006
URL
http://books.google.com.hk/books?id=3LPBjwEACAAJ&hl=&source=gbs_api
註釋
Fermilab has developed a second electron lens (TEL-2) for beam-beam compensation in the Tevatron as part of its Run II upgrade program. Operation of the beam position monitors (BPMs) in the first electron lens (TEL-1) showed a systematic transverse position difference between short proton bunches (2 ns sigma) and long electron pulses ({approx}1 us) of up to {approx}1.5 mm. This difference was attributed to frequency dependence in the BPM system. The TEL-2 BPMs utilize a new compact four plate design with grounding strips between plates to minimize crosstalk. In-situ measurements of these new BPMs are made using a stretched wire pulsed with both proton and electron beam formats. In addition, longitudinal impedance measurements of the TEL-2 are presented. Signal processing algorithm studies indicate that the frequency dependent transverse position offset may be reduced to {approx}0.1 mm for the beam structures of interest.
