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Secondary Ion Mass Spectrometry
Paul van der Heide
其他書名
An Introduction to Principles and Practices
出版John Wiley & Sons, 2014-08-19
主題Science / Chemistry / AnalyticScience / Chemistry / General
ISBN11189167789781118916773
URLhttp://books.google.com.hk/books?id=4xdVBAAAQBAJ&hl=&source=gbs_api
EBookSAMPLE
註釋Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
• Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
• Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
• Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other