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Reliability and Degradation of III-V Optical Devices

Osamu Ueda

出版	Artech House, 1996
主題	Science / Physics / CrystallographyScience / Physics / Optics & LightScience / Physics / Condensed MatterTechnology & Engineering / Electronics / OptoelectronicsTechnology & Engineering / Electronics / SemiconductorsTechnology & Engineering / Fiber Optics
ISBN	08900665239780890066522
URL	http://books.google.com.hk/books?id=5TFTAAAAMAAJ&hl=&source=gbs_api

註釋

In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. Understanding the origins and causes of degradation is critical to successful design. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.