| 其他書名 | Chapter 3. Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction |
| 出版 | Elsevier Inc. Chapters, 2013-04-11 |
| 主題 | Science / Applied SciencesTechnology & Engineering / Electronics / SemiconductorsScience / Spectroscopy & Spectrum AnalysisScience / Chemistry / AnalyticScience / Chemistry / InorganicTechnology & Engineering / Materials Science / GeneralTechnology & Engineering / Nanotechnology & MEMSScience / Physics / GeneralScience / Chemistry / Physical & Theoretical |
| ISBN | 01280833609780128083369 |
| URL | http://books.google.com.hk/books?id=7-ZzDAAAQBAJ&hl=&source=gbs_api |
| EBook | SAMPLE |