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Patterning of Material Layers in Submicron Region
註釋This book is endowed with quantitative features of the operational ingredients such as sources, resists, masks, writing/aligning/scanning techniques and commercial/captive systems. It is profusely illustrated with layout diagrams, flowcharts, analyses and SEM pictures of novel results to ensure lucidity. The book also presents various recent developments such as X-ray mask preparation, plasma developing resists and compact synchrotron with statistical details.