登入選單
返回Google圖書搜尋
Characterisation of Radiation Damage by Transmission Electron Microscopy
註釋Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus