Quantifying the Effect of Metal-rich Precipitates on Minority Carrier Diffusion Length in Multicrystalline Silicon Using Synchrotron-based Spectrally Resolved X-ray Beam-induced Current

Tonio BuonassisiAndrei A. IstratovMatthew D. PickettMatthew A. MarcusGiso HahnStephan RiepeJörg IsenbergWilhelm WartaGerd WillekeTed F. CiszekEicke Weber

出版	Bibliothek der Universität Konstanz, 2005
URL	http://books.google.com.hk/books?id=9KAHugEACAAJ&hl=&source=gbs_api