登入選單

返回Google圖書搜尋

Design of Addressable Low Noise Test Points as a Generic Block for Testability and Observability of Various High-performance Analog Designs

Sahil Arora

出版	2008
URL	http://books.google.com.hk/books?id=9KgpQwAACAAJ&hl=&source=gbs_api