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Syndrome testable design of combinational circuits

Stanford University. Computer Systems LaboratoryJ. Savir

出版	Center for Reliable Computing, Computer Systems Laboratory, Stanford University, 1978
URL	http://books.google.com.hk/books?id=C9puGwAACAAJ&hl=&source=gbs_api

註釋

In this paper we describe a method of designing combinational circuits in such a way that their test procedure will require the knowledge of only one characteristic of the fault-free circuit, called the syndrome. This solves the storage problem associated with the test procedure. It is shown that the syndrome-testable design is inexpensive and can be easily implemented by the logic designer.