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Google圖書搜尋
Synchrotron-based Spectrally-resolved X-ray Beam Induced Current
Tonio Buonassissi
Andrei A. Istratov
Matthew D. Pickett
Matthew A. Marcus
Giso Hahn
Stephan Riepe
Jörg Isenberg
Wilhelm Warta
Gerd Willeke
Ted F. Ciszek
其他書名
A Technique to Quantify the Effect of Metal-rich Precipitates on Minority Carrier Diffusion Length in Multicrystalline Silicon
出版
NREL
, 2005
URL
http://books.google.com.hk/books?id=Fb_QuQEACAAJ&hl=&source=gbs_api