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Metrology and Physical Mechanisms in New Generation Ionic Devices
Umberto Celano
出版Springer, 2016-06-18
主題Science / Spectroscopy & Spectrum AnalysisTechnology & Engineering / Nanotechnology & MEMSTechnology & Engineering / Materials Science / GeneralScience / Chemistry / AnalyticScience / Physics / GeneralTechnology & Engineering / Manufacturing
ISBN33193953199783319395319
URLhttp://books.google.com.hk/books?id=IfR6DAAAQBAJ&hl=&source=gbs_api
EBookSAMPLE
註釋This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.