| 其他書名 | Proceedings of the 29Th International Symposium for Testing and Failure Analysis |
| 出版 | ASM International, 2003-01-01 |
| 主題 | Technology & Engineering / Electronics / DigitalTechnology & Engineering / Electronics / Microelectronics |
| ISBN | 16150308679781615030866 |
| URL | http://books.google.com.hk/books?id=JKuth6aVHIwC&hl=&source=gbs_api |
| EBook | SAMPLE |