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2018 IEEE ACM 3rd International Workshop on Metamorphic Testing (MET)
ACM/IEEE International Workshop on Metamorphic Testing
IEEE Staff
Xiaoyuan Xie
出版
IEEE
, 2018-05-27
主題
Technology & Engineering / General
ISBN
1538661802
9781538661802
URL
http://books.google.com.hk/books?id=JZ2RuwEACAAJ&hl=&source=gbs_api
註釋
ICSE is the premier forum for researchers to present and discuss the most recent innovations, trends, outcomes, experiences, and challenges in the field of software engineering The scope is broad and includes all original and unpublished results of empirical, conceptual, experimental, and theoretical software engineering research