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2018 IEEE ACM 3rd International Workshop on Metamorphic Testing (MET)
ACM/IEEE International Workshop on Metamorphic TestingIEEE StaffXiaoyuan Xie
出版IEEE, 2018-05-27
主題Technology & Engineering / General
ISBN15386618029781538661802
URLhttp://books.google.com.hk/books?id=JZ2RuwEACAAJ&hl=&source=gbs_api
註釋ICSE is the premier forum for researchers to present and discuss the most recent innovations, trends, outcomes, experiences, and challenges in the field of software engineering The scope is broad and includes all original and unpublished results of empirical, conceptual, experimental, and theoretical software engineering research