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Test and Diagnosis for Small-Delay Defects
Mohammad Tehranipoor
Ke Peng
Krishnendu Chakrabarty
出版
Springer Science & Business Media
, 2011-09-08
主題
Technology & Engineering / Electronics / Circuits / General
Computers / Hardware / General
Technology & Engineering / Nanotechnology & MEMS
Technology & Engineering / Electrical
Computers / Software Development & Engineering / Systems Analysis & Design
Technology & Engineering / Manufacturing
ISBN
1441982973
9781441982971
URL
http://books.google.com.hk/books?id=JeMz2QOtjUIC&hl=&source=gbs_api
EBook
SAMPLE
註釋
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.