登入
選單
返回
Google圖書搜尋
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
Ronald Donald Schrimpf
Dan M. Fleetwood
出版
World Scientific
, 2004
主題
Technology & Engineering / Electronics / General
Technology & Engineering / Electrical
Technology & Engineering / Electronics / Circuits / General
Technology & Engineering / Electronics / Semiconductors
ISBN
9812389407
9789812389404
URL
http://books.google.com.hk/books?id=KrtpDQAAQBAJ&hl=&source=gbs_api
EBook
SAMPLE
註釋
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semi-conductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.