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Nomographs for Use in the Fabrication and Testing of Ge (Li) Detectors

Alvin H. Sher

出版	U.S. National Bureau of Standards, 1970
URL	http://books.google.com.hk/books?id=MxMkw7wgmJQC&hl=&source=gbs_api
EBook	FULL_PUBLIC_DOMAIN

註釋

Six nomographs which can facilitate the fabrication and testing of lithium-drifted germanium gamma-ray detectors (Ge(Li) detectors) have been constructed which relate the following parameters:time, temperature, applied bias, and drifted depth:lithium mobility, crystal resistivity, and oxygen concentration; area, capacitance, and drifted depth for planar Ge(Li) detectors; drifted depth, length, and capacitance for coaxial Ge(Li) detectors; total spectral resolution; system noise, and detector resolution; gamma-ray energy, and effective Fano factor.The use of these nomographs is described and illustrative examples are given.(Author).