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VLSI Test Principles and Architectures
Laung-Terng WangCheng-Wen WuXiaoqing Wen
其他書名
Design for Testability
出版Elsevier, 2006-08-14
主題Technology & Engineering / Industrial Design / ProductTechnology & Engineering / Electronics / Circuits / Integrated
ISBN00804747999780080474793
URLhttp://books.google.com.hk/books?id=P1ea4znZhGsC&hl=&source=gbs_api
EBookSAMPLE
註釋This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.