登入選單
返回Google圖書搜尋
High Resolution Structural Investigation of Synthetic and Natural 2
其他書名
1 Clay-mineral Assemblages Using Advanced Sample Preparation and Electron Microscopy Imaging Techniques
出版McGill University, 2011
ISBN04947881949780494788196
URLhttp://books.google.com.hk/books?id=Pc4OnQEACAAJ&hl=&source=gbs_api
註釋In this study, X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and conventional TEM (CTEM) of Pt-C replicas are used to characterize both synthetic and natural 2:1 clay minerals from a variety of geological environments. In manuscript 1, reference samples of illite and expandable 2:1 clay minerals (i.e., smectite-group minerals, vermiculite and rectorite) varying in interlayer charge were investigated to characterize their interlayer expansion after treatment with octadecylammonium (nC=18) cations. The results of this study show that the treatment of ultrathin sections of 2:1 clay minerals with nC=18 cations and their subsequent investigation under the HRTEM provide information on the distribution of layer charges and layer-charge heterogeneities that cannot be obtained with conventional techniques of sample preparation. The major objective of manuscript 2 is to test whether oxalate catalyzes the crystallization of saponite at ...