登入選單

返回Google圖書搜尋

Automatic Test Reordering for Electrical and Thermal Stress During Monitored Burn-in

Kaushik Roy

出版	School of Electrical Engineering, Purdue University, 1994
URL	http://books.google.com.hk/books?id=V558rgEACAAJ&hl=&source=gbs_api