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Tutorial - Defect Induced Failure Mechanisms Accelerated by Environmental Stress Screening
C. E. Mandel, Jr.
Billy R. Livesay
出版
Institute of Environmental Sciences & Technology/IEST
, 1990
主題
Technology & Engineering / Engineering (General)
Technology & Engineering / Environmental / General
ISBN
1877862045
9781877862045
URL
http://books.google.com.hk/books?id=VTwYAQAAMAAJ&hl=&source=gbs_api
