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Positron Annihilation in Semiconductors
Reinhard Krause-RehbergHartmut S. Leipner
其他書名
Defect Studies
出版Springer Science & Business Media, 1999-01-21
主題Science / Chemistry / AnalyticScience / Chemistry / Physical & TheoreticalScience / Physics / CrystallographyScience / Physics / NuclearScience / Physics / Atomic & MolecularScience / Physics / Condensed MatterScience / Spectroscopy & Spectrum AnalysisTechnology & Engineering / Electronics / GeneralTechnology & Engineering / Electronics / SemiconductorsTechnology & Engineering / Engineering (General)Technology & Engineering / Materials Science / GeneralTechnology & Engineering / Materials Science / Electronic Materials
ISBN35406437109783540643715
URLhttp://books.google.com.hk/books?id=WXOkEvr4sxcC&hl=&source=gbs_api
EBookSAMPLE
註釋The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.