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UW VLSI Chip Tester

Neil McKenzie

出版	Department of Computer Science and Engineering, University of Washington, 1989
URL	http://books.google.com.hk/books?id=XkRZHQAACAAJ&hl=&source=gbs_api

註釋

We present a design for a low-cost, functional VLSI chip tester. It is based on the Apple MacIntosh II personal computer. It tests chips that have up to 128 pins. All pin drivers of the tester are bidirectional; each pin is programmed independently as an input or an output. The tester can test both static and dynamic chips. Rudimentary speed testing is provided. Chips are tested by executing C programs written by the user. A software library is provided for program development. Tests run under both the Mac Operating System and A/UX. The design is implemented using Xilinx Logic Cell Arrays. Price/performance tradeoffs are discussed. (rrh).