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High Resolution X-Ray Diffractometry And Topography
D.K. BowenBrian K. Tanner
出版CRC Press, 1998-02-05
主題Technology & Engineering / Civil / GeneralTechnology & Engineering / Lasers & PhotonicsTechnology & Engineering / Materials Science / GeneralTechnology & Engineering / Environmental / GeneralTechnology & Engineering / ElectricalScience / Physics / Optics & LightScience / Life Sciences / General
ISBN02039791929780203979198
URLhttp://books.google.com.hk/books?id=YjFiMZ_sD8cC&hl=&source=gbs_api
EBookSAMPLE
註釋The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization