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A Technique for Evaluating the Application of the Pin-level Stuck-at Fault Model to VLSI Circuits

Daniel L. Palumbo

出版	National Aeronautics and Space Administration, Scientif. and Techn. Information Branch, 1987
URL	http://books.google.com.hk/books?id=Z6ETAQAAIAAJ&hl=&source=gbs_api