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Trace Characterization, Chemical and Physical

W. Wayne Meinke

出版	Department of Commerce, National Bureau of Standards, 1967
URL	http://books.google.com.hk/books?id=ZmM0HgbW0tUC&hl=&source=gbs_api
EBook	FULL_PUBLIC_DOMAIN

註釋

A symposium on Trace Characterization, Chemical and Physical was held at the National Bureau of Standards October 3-7, 1966.The volume contains the texts of invited lectures, and summaries by the rapporteurs of the contributed papers and discussion sessions.Topics covered include trace characterization and the properties of materials; electrical measurements; electrochemical methods; optical and x-ray spectroscopy; x-ray diffraction; optical methods; chemical spectrophotometry; nuclear methods; mass spectroscopy; preconcentration; sampling and reagents; and electron and optical microscopy.(Author).