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Advanced Techniques for Microstructural Characterization

R. Krishnan

出版	Trans Tech Publications, 1988
主題	Science / NanoscienceTechnology & Engineering / Engineering (General)Technology & Engineering / Materials Science / General
ISBN	08784956309780878495634
URL	http://books.google.com.hk/books?id=a8VOAQAAIAAJ&hl=&source=gbs_api

註釋

Coverage includes: metallic glasses; X-ray topography; auger spectroscopy; positron annihilation; and field ion microscopy.