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Analytical Techniques for the Characterization of Compound Semiconductors
G. Bastard
H. Oppolzer
出版
Elsevier
, 1991-07-26
主題
Science / Physics / General
Technology & Engineering / Materials Science / General
ISBN
9780444596727
0444596720
URL
http://books.google.com.hk/books?id=e62kC-UXEIMC&hl=&source=gbs_api
EBook
SAMPLE
註釋
This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.