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Google圖書搜尋
Generation of Oxide Charges and Interface States in Poly-silicon Gate MOS Capacitors by Fowler-Nordheim Tunneling
Charles Ching-Hsiang Hsu
出版
Solid State Electronics Laboratory, Department of Electrical and Computer Engineering, University of Illinois
, 1985
URL
http://books.google.com.hk/books?id=etaSGwAACAAJ&hl=&source=gbs_api