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Scanning Probe Microscopy and Electrical Transport Studies of Ferroelectric Thin Films and 2D Van Der Waals Materials

Zhiyong Xiao

出版	University of Nebraska-Lincoln, 2017
ISBN	03555030939780355503098
URL	http://books.google.com.hk/books?id=gUbNzwEACAAJ&hl=&source=gbs_api

註釋

In this dissertation, I present the scanning microscopy and electrical transport studies of ferroelectric thin films and ferroic/2D van der Waals heterostructures. Based on the conducting probe atomic force microscopy and piezo-response force microscopy (PFM) studies of the static and dynamic behavior of ferroelectric domain walls (DW), we found that the ferroelectric polymer poly(vinylidene-fluoride-trifluorethylene) P(VDF-TrFE) is composed of two-dimensional (2D) ferroelectric monolayers (MLs) that are weakly coupled to each other. We also observed polarization asymmetry in epitaxial thin films of ferroelectric Pb(Zr,Ti)O3, which is attributed to the screening properties of the underlying conducting oxide. PFM studies also reveal ferroelectric relaxor-type behavior in ultrathin Sr(Zr,Ti)O3 films epitaxially deposited on Ge.