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A Solid-state System for Measurement of Integrated Refractive Index
註釋A solid-state phase system is presented which is capable of indicating the variability of the integrated refractive index over line-of-sight propagation paths with extreme reliability. The system has a stability, which is independent of path length, of 1 pp 108 / 24 hr and 1 pp 109 / sec. Measurement precision is limited only by the resolution of the output phase meter and is 0.5% of full scale. Tabulated design criteria, component specifications, and illustrated circuit schematics are presented. Refractive index measurements with the phase system taken across a 1.6-km reservoir are compared to the average of conventional meteorological measurements of refractive index taken at the midway point and two terminal points for a 5-day period. The two measurements show a correlation estimate of 0.99 over the 5-day period.