登入選單
返回Google圖書搜尋
註釋The world is often considered to behave approximately linearly. However, many real-life phenomena are inherently nonlinear! Hence, in order to accurately model the true behavior of a radio-frequency device or system, its nonlinear characteristics can no longer be ignored and should be taken into account. To do so, one should first be able to measure these nonlinear effects. After some years of hesitation, the high-frequency measurement world finally acknowledged the necessity to accurately measure the in- and out-of-band nonlinear behavior of a radio-frequency (RF) device or system. Since then, different measurement approaches have been developed to achieve this goal. The two major measurement principles being pursued are the sampler-based and the mixer-based methodology. The calibration and de-embedding process of nonlinear measurements is quite involved and requires special calibration standards. From the acquired “nonlinear” measurement data, one can then build a model that accurately describes the in-band and out-of-band nonlinear behavior of an RF system. This chapter will show the reader how to do accurate nonlinear RF measurements and how to obtain a simple and robust characterization of the nonlinear behavior of an RF system.