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Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Xiong DuJun ZhangGaoxian LiYaoyi YuCheng QianRui Du
出版Springer Nature, 2022-07-08
主題Technology & Engineering / Power Resources / GeneralTechnology & Engineering / Electronics / Circuits / GeneralTechnology & Engineering / MachineryTechnology & Engineering / Electronics / GeneralTechnology & Engineering / Electrical
ISBN98119313219789811931321
URLhttp://books.google.com.hk/books?id=ijx6EAAAQBAJ&hl=&source=gbs_api
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註釋This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.