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Complex Semiconductors Operating at Low Temperatures
Mogens Bo Christensen
其他書名
Comparative Life Test Evaluation of Three Variants of 256Kx1 NMOS DRAM and Three Variants of 8Kx8 CMOS SRAM Operating at Low Temperatures
出版Electronikcentralen, 1987
ISBN87739807819788773980781
URLhttp://books.google.com.hk/books?id=k9bRAQAACAAJ&hl=&source=gbs_api