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DC and RF Characterization of NiSi Schottky Barrier MOSFETs with Dopant Segregation
Christoph Johannes Urban
出版Forschungszentrum Jülich, 2010
ISBN389336644X9783893366446
URLhttp://books.google.com.hk/books?id=kEypwK5lUi4C&hl=&source=gbs_api
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