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Fringe Pattern Analysis for Optical Metrology
Manuel Servin
J. Antonio Quiroga
Moises Padilla
其他書名
Theory, Algorithms, and Applications
出版
John Wiley & Sons
, 2014-08-18
主題
Technology & Engineering / Optics
Science / Physics / General
Science / Physics / Electromagnetism
ISBN
3527411526
9783527411528
URL
http://books.google.com.hk/books?id=mXDrAwAAQBAJ&hl=&source=gbs_api
EBook
SAMPLE
註釋
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.