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Advanced Laser Diode Reliability
Massimo Vanzi
Laurent Bechou
Mitsuo Fukuda
Giovanna Mura
出版
Elsevier
, 2021-07-24
主題
Technology & Engineering / Electronics / Solid State
Technology & Engineering / Electronics / Microelectronics
Technology & Engineering / Electronics / Digital
Technology & Engineering / Electronics / General
ISBN
0081010893
9780081010891
URL
http://books.google.com.hk/books?id=mlefDAAAQBAJ&hl=&source=gbs_api
EBook
SAMPLE
註釋
Advanced Laser Diode Reliability
focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.
Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda
Present the extension to new failure mechanisms, new technologies, new application fields, new environments
Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities