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X-Ray Compton Scattering
Malcolm Cooper
Peter Mijnarends
Nobuhiro Shiotani
Nobuhiko Sakai
Arun Bansil
出版
OUP Oxford
, 2004-10-14
主題
Science / Physics / General
Science / Physics / Condensed Matter
Technology & Engineering / Materials Science / General
Science / Physics / Crystallography
ISBN
0191523038
9780191523038
URL
http://books.google.com.hk/books?id=nQlREAAAQBAJ&hl=&source=gbs_api
EBook
SAMPLE
註釋
With the development of potent x-ray sources at many synchrotron laboratories worldwide, Compton scattering has become a standard tool for studying electron densities in materials. This book provides condensed matter and materials physicists with an authoritative, up-to-date, and very accessible account of the Compton scattering method, leading to a fundamental understanding of the electrical and magnetic properties of solid materials. The spectrum of Compton scattered x-rays is particularly sensitive to this behaviour and thus can be used as a direct probe and to test the predictions of theory. The current generation of synchrotron facilities allows this method to be readily exploited to study the ground state electron density in both elements and in complex compounds. It is important that those working in related fields, as well as the increasing number directly using the Compton method, have a comprehensive assessment of what is now possible and how to achieve it, in addition to a full understanding of its theoretical basis. This monograph is unique and timely, since little of what is described, was practicable a decade ago. The development of synchrotron radiation facilities has ensured that the technique described here will remain a powerful probe of electron charge and spin density for many years to come.