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Detection of Intermittent Faults in Sequential Circuits

Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryJ. Savir

出版	Digital Systems Laboratory, Department of Electrical Engineering, Stanford Univ., 1978
URL	http://books.google.com.hk/books?id=nVoFAAAAIAAJ&hl=&source=gbs_api

註釋

This paper shows that the testing properties of intermittent faults in sequential circuits can be studied by means of a probabilistic automaton. The evaluation and derivation of optimal intermittent fault detection experiments in sequential circuits is done by creating a product state table from the faulty and fault-free versions of the circuit under test. Both deterministic and random test procedures are discussed. The underlying optimality criterion maximizes the probability of fault detection.