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Generating Circuit Tests by Exploiting Designed Behavior
Mark Harper Shirley
Massachusetts Institute of Technology. Artificial Intelligence Laboratory
出版
Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science
, 1988
URL
http://books.google.com.hk/books?id=oeDmQgAACAAJ&hl=&source=gbs_api
註釋
Abstract: "Generating tests for sequential devices is one of the hardest problems in manufacturing digital circuits. This task is difficult primarily because internal components are accessible only indirectly, forcing a test generator to use the surrounding components collectively as a probe for detecting faults. This in turn forces the test generator to reason about complex interactions between the behaviors of these surrounding components. Current automated solutions are becoming ineffective as designs grow larger and more complex. Yet, despite the complexity, human experts remain remarkably successful, in part, because they use knowledge from many sources and use a variety of reasoning techniques.