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Noncontact Atomic Force Microscopy
S. MoritaRoland WiesendangerE. Meyer
出版Springer Science & Business Media, 2002-07-24
主題Mathematics / MeasurementScience / Space Science / AstronomyScience / Microscopes & MicroscopyScience / NanoscienceScience / Weights & MeasuresScience / Physics / Condensed MatterTechnology & Engineering / GeneralTechnology & Engineering / ManufacturingTechnology & Engineering / Materials Science / GeneralTechnology & Engineering / Materials Science / Thin Films, Surfaces & InterfacesTechnology & Engineering / MeasurementTechnology & Engineering / Nanotechnology & MEMS
ISBN35404311799783540431176
URLhttp://books.google.com.hk/books?id=omrO6fIgfSMC&hl=&source=gbs_api
EBookSAMPLE
註釋Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.