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Structural and Chemical Characterization of Thin Films and Crystal Surfaces

Eric William Landree

出版	Northwestern University, 1998
URL	http://books.google.com.hk/books?id=tbT_NwAACAAJ&hl=&source=gbs_api

註釋

Surface diffraction data (transmission electron diffraction or grazing incidence X-ray diffraction) has also proven to be a powerful tool for characterizing the crystallographic structure of surfaces. However, while surface diffraction data is particularly useful for refining a given structure model, an initial guess of the surface structure is required. Techniques such as STM and HREM do offer some insight about the surface structure, but they too have limitations. A means of directly analyzing surface diffraction data has been developed based on classical bulk direct methods for generating a 2D potential (electron density) map of the surface. The development of this technique for various 2D simulated data sets will be discussed and its application to experimental data will be shown including the solution of the TiO 2(100)-1 x 3 reconstruction.