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Scanning Electron Microscopy
Ludwig Reimer
其他書名
Physics of Image Formation and Microanalysis
出版Springer, 2013-11-11
主題Science / Spectroscopy & Spectrum AnalysisScience / Physics / Condensed MatterScience / Physics / GeneralScience / Chemistry / Analytic
ISBN35403896799783540389675
URLhttp://books.google.com.hk/books?id=ulrvCAAAQBAJ&hl=&source=gbs_api
EBookSAMPLE
註釋Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.