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Local Electrode Atom Probe Tomography
David J. Larson
Ty J. Prosa
Robert M. Ulfig
Brian P. Geiser
Thomas F. Kelly
其他書名
A User's Guide
出版
Springer Science & Business Media
, 2013-12-12
主題
Technology & Engineering / Materials Science / General
Science / Nanoscience
Science / Spectroscopy & Spectrum Analysis
Technology & Engineering / Nanotechnology & MEMS
Technology & Engineering / Manufacturing
Science / Chemistry / Analytic
ISBN
1461487218
9781461487210
URL
http://books.google.com.hk/books?id=wPa8BAAAQBAJ&hl=&source=gbs_api
EBook
SAMPLE
註釋
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.